Exhibition: X-RAYS of Balenciaga, Chanel, Dior, and Givenchy — Closes
Gallery FIT, The Museum at FIT Fashion Institute of Technology, New York City, NY, United StatesFebruary 6–16, 2019 X-RAYS of Balenciaga, Chanel, Dior, and Givenchy is the result of a collaboration between the students of FIT’s Fashion Design MFA program and The Museum at FIT. The project is part of a course titled “Fashion Creation 3—Design Archaeology,” which centers on the concept that in order to move design forward, it is […]